作　　者： (）;

机构地区： Industrial Technology Development, National Centre for Physics, Islamabad, Pakistan

出　　处： 《Journal of Semiconductors》 2017年第9期14-18,共5页

摘　　要： The crystal structure, electrical and optical properties of ZnSe thin films deposited on an In203 ：Sn （ITO） substrate are evaluated for their suitability as the window layer of CdTe thin film solar cells. ZnSe thin films of 80, 90, and 100 nm thickness were deposited by a physical vapor deposition method on Indium tin oxide coated glass substrates. The lattice parameters are increased to 5.834 A when the film thickness was 100 rim, which is close to that of CdS. The crystallite size is decreased with the increase of film thickness. The optical transmission analysis shows that the energy gap for the sample with the highest thickness has also increased and is very close to 2.7 eV. The photo decay is also studied as a function of ZnSe film thickness. The crystal structure, electrical and optical properties of ZnSe thin films deposited on an In203 ：Sn （ITO） substrate are evaluated for their suitability as the window layer of CdTe thin film solar cells. ZnSe thin films of 80, 90, and 100 nm thickness were deposited by a physical vapor deposition method on Indium tin oxide coated glass substrates. The lattice parameters are increased to 5.834 A when the film thickness was 100 rim, which is close to that of CdS. The crystallite size is decreased with the increase of film thickness. The optical transmission analysis shows that the energy gap for the sample with the highest thickness has also increased and is very close to 2.7 eV. The photo decay is also studied as a function of ZnSe film thickness.