作　　者： ; ; ; ; (胡乔生）;

机构地区： 厦门大学材料学院材料科学与工程系

出　　处： 《金属学报》 2003年第7期775-780,共6页

摘　　要： 利用DSC,X射线衍射及分光光度计,对Sb-Se系和Ge-Sb-Te系记录介质的热力学参数、非晶态薄膜相变前后结构的变化及光学性能进行了系统的研究,结果表明:Sb—Se系非晶态的光稳定性很不理想,随着彼长的改变,反射率变化太快。对于Ge—Sb—Te系的两种成分合金,在各种波段处都有较大的反衬度,其非晶态的光稳定性也比较理想,随着波长的改变,反射率变化不大。 Thermodynamic parameters, the structural transformation and optical properties before and after the phase transforms of amorphous films of Sb-Se-based and Ge-Sb-Te-based phase change optical disk recording media were studied by using DSC, X-ray diffraction and spectrometer. The results show that Sb-Se-based alloys in amorphous state have not a satisfactory light stability, as its reflectivity changes significantly fast with the change of the wavelength. The Ge-Sb-Te alloys with two compositions have a relatively high reflectivity at any wavelength segment, and possess an ideal light stability in amorphous state, no obvious change occurs in their reflectivity with the changes of the wavelength.

关 键 词： 相变光盘 记录介质 热力学参数 光学 薄膜

领　　域： [理学] [理学] [理学] [理学]