帮助 本站公告
您现在所在的位置:网站首页 > 知识中心 > 文献详情
文献详细Journal detailed

VHF等离子体光发射谱(OES)的在线监测
Diagnosis of VHF plasmas with optical emission spectroscopy

作  者: ; ; ; ; ; ; ; ; ;

机构地区: 东华大学理学院

出  处: 《物理学报》 2003年第9期2324-2330,共7页

摘  要: 采用光发射谱 (OES)测量技术 ,对不同制备条件下的甚高频 (VHF)等离子体辉光进行了在线监测 .实验表明 ,VHF等离子体中特征发光峰 (Si ,SiH ,H α ,H β 等 )的强度较常规的射频 (RF)等离子体明显增强 ,并且在制备 μc Si:H的工艺条件下 (H稀释度R(H2 SiH4 ) =2 3) ,随激发频率的增加而增大 ,这些发光峰的变化趋势与材料沉积速率的变化规律较相似 .SiH 峰等的强度随气压的变化则因硅烷H稀释度及功率的不同而异 :高H稀释 (R =2 3)时 ,SiH 峰强度在低辉光功率下随反应气压的增大单调下降 ,在高辉光功率下随气压的变化呈现类高斯规律 ;低H稀释 (R =5 .7)时 ,SiH 峰随气压的变化基本上是单调下降的 ,下降速率也与功率有关 ,这些结果表明 ,VHF PECVD制备 μc Si:H和a Si:H的反应动力学过程存在较大差异 .此外 ,随着激发功率的增大 ,Si ,SiH 峰都先迅速增大然后趋于饱和 ,并且随着H稀释率的增大 ,将更快呈现饱和现象 .通过对OES结果的分析与讨论可知 ,VHF PECVD技术沉积硅基薄膜可以有效提高沉积速率 ,而且 ,硅基薄膜的沉积速率的进一步提高需要综合考虑H稀释度。 Very high frequency (VHF) Plasma and its glow discharge mechanism during the deposition of muc-Si: H film have been studied by means of optical emission spectroscopy (OES) technique in this paper. From the measured OES spectra, where the valuable information on the Si*, SiH*, H* and H-2* intensities were provided,the influence of deposition conditions on the VHF plasma has been investigated. The intensities of SiH*, H-2* and H* of VHF-gas deposition(GD) to deposit muc-Si: H were much higher than those of RF-GD to deposit a-Si: H. Under the experiment condition to deposit muc-Si: H, Si*, SiH*, the H* and H-2* intensities increased obviously with the excitation frequency, and the variation of the deposition rate with the excitation frequency was similar to that of SiH*. The SiH* intensity of VHF-GD became higher than its Si* intensity as the hydrogen dilution ratio decreased. The influences of the hydrogen dilution ratio on the plasma optical emission spectra also depended on the reaction pressure, the excitation power as well as the excitation frequency. In the case of the hydrogen ratio ( R = H-2/SiH4) R = 23, the SiH* intensity decreased monotonously against the excitation pressure at a low excitation power (e. g. 5W). But the SiH* intensity increased at first, then decreased with the increase of the pressure at the high excitation power (e. g. 11 - 55W). In the case of the hydrogen ratio R = 5.7, the SiH* intensity decreased monotonously against the excitation pressure for all the excitation power. The Si*, SiH*, H* and H-2* intensities also increased with the excitation power and then trended to be saturated, and they are easier to saturate with the increase of the hydrogen dilution ratio. All the experimental results demonstrated that the influences of the excitation frequency, the excitation power, the reaction pressure and the hydrogen dilution ratio were correlative, none of the deposition conditions is the critical factor to improve the deposition rate.

关 键 词: 甚高频等离子体辉光 光发射谱 在线监测 技术 甚高频等离子体化学气相沉积 硅基薄膜 太阳能电池

领  域: [电子电信] [电气工程]

相关作者

作者 杨励
作者 赵必荣

相关机构对象

机构 华南理工大学
机构 广东外语外贸大学
机构 广东外语外贸大学国际经济贸易学院
机构 广东轻工职业技术学院
机构 广东轻工职业技术学院应用外语系

相关领域作者

作者 刘洋
作者 黄立
作者 毕凌燕
作者 廖建华
作者 王珺