作　　者： ; ; ; (彭先觉）;

机构地区： 北京应用物理与计算数学研究所

出　　处： 《核动力工程》 2014年第S2期16-18,共3页

摘　　要： 用稠密等离子体聚焦源测量法确定次临界装置的瞬发中子衰减常数时发现,反射层材料不同的次临界装置具有不同的中子时间特性。本文采用蒙特卡罗方法分析带含氢反射层和带金属反射层两种次临界装置的有效增殖因数(keff)、瞬发中子代时间、能谱等中子学参数的时间特性。结果表明,对含氢反射层装置,在10-6 s的时间尺度内,泄漏的快信号反映装置内部活性区的特性;在10-6~10-4 s或更长量级的时间尺度内,中子的谱形和空间分布逐渐趋于平衡,泄漏信号表征整个次临界装置的定态特性。 In the study of the method to diagnose the prompt neutron decay constant of the subcritical device by the Dense Plasma Focus source, the different neutron time characteristics are found in the subcritical device with different reflective layer, such as a metal reflector and a hydrogenous reflector. The different neutron time characteristics like keff, prompt neutron generation time, energy spectrum, and the different of prompt neutron decay constant within different energy segments and different geometric segments is analyzed by the Monte Carlo method. The results showed that, in the subcritical device with a hydrogenous reflective layer, within 10-6 s time scale, the leakage fast signal of the device can fully reflects the characteristics of the active region. In 10-6 ~10-4 s or much longer time, the shape of the leakage neutron spectrum and space spectrum may fully reflects the whole device.

关 键 词： 次临界 时间特性 瞬发中子衰减常数

领　　域： [理学] [理学]