机构地区: 中国科学技术大学人文与社会科学学院科技史与科技考古系
出 处: 《核技术》 2002年第10期853-858,共6页
摘 要: 用SRXRF技术对汝瓷断面从釉到胎进行了十一种元素含量的线扫描分析 ,结果表明 :在汝瓷胎、釉之间的确存在一个元素含量与两者相差很大的中间层。我们认为这是汝瓷在烧制过程中 ,瓷釉在形成玻璃态的同时渗入了瓷胎表面而形成的 ,这个中间层在实体光学显微镜上能明显看出而在偏光显微镜和扫描电镜下看不到。此工作不仅有助于研究汝瓷的结构和烧造工艺 。 The technique of the SRXRF line scan analysis was used to measure contents of 11 elements at the broken plane of the Ru porcelain from porcelain glaze to body. It is found that there exists a great different layer of contents of elements between the porcelain glaze and body. The mechanism may be that in the process of firing the porcelain, materials of glass-glaze of porcelain glaze infiltrate into the surface of porcelain body, that could fit the phenomenon of observation by different microscopes (stereomicroscope, polarizing microscope and scanning electron microscope).