作　　者： ; ; ;

机构地区： 韶关学院物理与机电工程学院

出　　处： 《韶关学院学报》 2012年第8期42-46,共5页

摘　　要： 动态光散射技术是进行纳米及亚微米颗粒粒径测量的一种有效方法.通过对量子点特性和动态光散射系统的分析,提出了一种基于动态光散射测量量子点粒径的实验方法,构建实验装置并进行测量与分析.通过CONTIN算法反演量子点粒径,并与电子显微镜和粒径公式得到的粒径数据进行比较,证明动态光散射法是测量量子点粒径的一种有效的方法,为量子点光学特性的快速分析提供了一种新的途径. Dynamic light scatting （DLS） technique is an effective method of nano and submicron particle size measurement. In this paper, a experiment method to measure quantum dots based on DLS was built with the analysis of the quantum dots and dynamic light scattering system. Experimental device is established to finish the test and analysis by contin algorithm from correlation curve.The data form was c inversion of the experimental data, the size of quantum dots was got ompared with that from election microscope and particle size formula. The results show that the dynamic light scattering is an effective method for measuring the particle size of quantum dots and provide a new and fast means of the analysis of the optical properties of quantum dots.

关 键 词： 动态光散射 量子点 光学特性 粒径测量

领　　域： [机械工程] [理学] [理学]