作　　者： ; ; ; ;

机构地区： 华南师范大学物理与电信工程学院

出　　处： 《激光杂志》 2012年第3期8-9,共2页

摘　　要： 采用消光式椭偏仪精确测量波片的相位延迟量。从理论上分析了椭偏仪测量波片相位延迟量的可行性,重点讨论了标准1/4波片及待测波片的相位延迟量误差对测量精度的影响,并给出相应的实验验证。实验表明:该方法测量过程简单,方便,易受光强波动的影响,测量相位延迟量重复性精度达0.02°,相对误差为0.02%,是一种实用及有效的波片相位延迟量测量的方法。 Phase retardation of the wave plate is accurately measured by a null ellipsometer. The feasibility of the method is analyzed theoretically in the paper. The influence of phase retardation error of the standard quarter - wave plate and the tested quarter - wave plate on the measurement precision is especially discussed and the corresponding experimental results are also given. The experiments show that the process of the measurement is simple, convenient and not easy to be influenced by light- intensity variation. Its precision can be as high as 0.02°,and the relative error isjust 0.02%. It is an useful and effective method of measuring phase retardation of the wave plate.

关 键 词： 波片 相位延迟量 消光式椭偏仪 测量精度 影响

领　　域： [电子电信]