作　　者： ; ; ;

机构地区： 哈尔滨工业大学

出　　处： 《光学精密工程》 2012年第3期484-491,共8页

摘　　要： 建立了红外探测器件低温背景探测率测试系统,实验研究了红外探测器件在低温背景下的探测特性,用于支持红外探测低温光学系统的合理设计。首先,介绍并分析了红外探测系统的噪声和响应特性,建立了低温光学系统设计与红外探测器件在低温背景下探测性能之间的关系;在热真空环境下搭建了基于变温面源黑体的低温背景探测率测试系统。然后,针对某红外器件在低温背景下的探测率进行了实验测量。最后,通过计算得到了低温背景下极限积分时间及探测特性相对于常温背景下的一般变化规律。实验结果表明:低温背景下极限积分时间及探测率均比常温背景下提高近20倍,提出的测试技术可为低温光学系统的指标设计提供依据与参考。 Abstract： To support the correct design of cryogenic optical systems, a measuring system for infrared detectors in low temperature background was established and applied to some infrared detectors for testing their detection characteristics. First, the theoretical analysis for noise and response characteristics of an infrared acquisition system was introduced, and the relationship between the design of a low temperature optical system and the detectivity of infrared detector in the low temperature back- ground was established. Then, a measurement system of detectivity in the low temperature background based on thermal vacuum enviroment was proposed, and experimental research on some infrared detectors in the low temperature background was accomplished. Finally, the variation regularities of limiting integration time and detectivity in low temperature compared with those in normal temperature case were discussed as well. Experimental results indicate that both of the integration time and detecitivity in the low temperature background are 20 times that in normal temperature background. The regularity derived cansatisfy the requirments of system index design of low temperature optical systems.

关 键 词： 红外探测器件 探测率检测 低温背景 低温光学系统 光学设计

领　　域： [电子电信] [自动化与计算机技术] [自动化与计算机技术]