作　　者： ; ; ; (李杰）;

机构地区： 上海交通大学机械与动力工程学院工业工程与物流工程系

出　　处： 《系统工程理论与实践》 2011年第8期1593-1599,共7页

摘　　要： 芯片测试系统中,由于检测设备的不稳定性、产品价值昂贵等原因,产品检测过程中出现质量问题后经过一定调整重新进入检测,会形成质量重入问题.该类质量问题与系统的随机特性结合,使得系统的产出,周期等与系统参数呈现出复杂的非线性关系特性.本研究结合某芯片测试企业的实际问题,采用马尔科夫方法构建了模型,并获得系统的性能指标与参数之间的数值量化关系.阐述了方法的应用过程,进行了系统的性能评估和改善,为实际系统提出了质量管理、缓存设计、周期控制的相关建议. In semiconductor test system,chips are inspected at the tester station.Because of the unsteady of the machines and some other technical issues with respect to products,the inspection results are not so reliable that the chips with quality issues will be treated and re-enter the testers.This phenomenon is defined as quality re-entrance which will influence the throughput and cycle time of the system dramatically. Besides that,the inspection times of the system are not constant but with some stochastic property. For these features,it＇s difficult to evaluate the system＇s performance.In this paper,we constructed a Markov model based upon the real semiconductor test system and obtained the throughput and cycle time performances.By the sensitivity analysis of the system,we studied the effects of the quality and the capacity limitation to the system performances and proposed some suggestions on system improvement.

关 键 词： 芯片测试 质量重入性 随机系统

领　　域： [理学] [理学] [理学] [理学] [一般工业技术]