机构地区: 厦门大学物理与机电工程学院物理学系
出 处: 《发光学报》 1999年第1期14-16,共3页
摘 要: 报道了对有序GaxIn1-xP(x=0.52)样品的变温和变激发功率密度的PL谱的研究.在低温T=17K,低激发功率密度下,谱线呈双峰结构,在低激发功率密度下升高温度,低能端的发光峰(以下简称A峰)发生热猝灭,并在85K左右完全消失.高能端的发光峰(以下简称B峰)积分强度则随温度升高先增强而后发生猝灭.采用低激发功率密度激发样品,A峰较B峰强.增大激发功率密度,B峰强度逐渐超过A峰强度并占据主导地位.激发功率密度增加约两个数量级时,发现B峰峰值位置不随激发功率密度移动,而A峰出现微小蓝移(6.2meV).初步分析表明,A峰与空间分离中心的复合有关,而B峰来自本征激子复合; An investigation on the properties of the temperature dependence and the excitation intensity dependence of photoluminescence of ordered Ga 0.52 In 0.48 P was carried out. Under the condition of low temperature of T =17K and low excitation intensity, the spectrum profile showed a double peaks structure. Changing the temperature and the excitation intensity respectively, the relative phenomena were discussed and a reasonable explanation was given.