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纳米级硅镁石微粒性能及其对纸料助留效果的研究
Characteristic of Cationic Humite Micro-particle and Its Effect as Retention Aid

作  者: ; ; ; ; ;

机构地区: 齐齐哈尔大学

出  处: 《中国造纸》 2010年第4期32-35,共4页

摘  要: 研究了阳离子硅镁石微粒的性能和其作为助留剂的助留效果。研究发现,硅镁石微粒具有纳米级的粒径和较高的正电性,其正电性随着pH值的增加逐渐降低;随着研磨时间的延长,硅镁石微粒的粒径逐渐降低,但其正电性也随着明显降低。硅镁石阳离子微粒单独作为助留剂使用时,具有一定的助留效果,但其用量大,且抗剪切性能差。硅镁石微粒与阴离子聚丙烯酰胺(APAM)组成的双元助留体系具有良好的助留效果,其中,未研磨的硅镁石微粒/APAM组成的体系具有良好的抗剪切性能和pH值适应性。因此,未研磨的硅镁石微粒与APAM组成的助留体系是一种理想的助留体系。 The characteristic of nanometer cationic humite micro-particle and its effect as a retention and drainage aid were studied in this paper. The results showed that the nanometer cationic humite micro-particle has high cationic Zeta potential. Its cationic Zeta potential increases while pH value dropps, and decreases while grinding time increases. The retention of the fillers and fines improves in certain degree when a large amount of nanometer cationic humite is added alone which is sensitive to shear. When nanometer cationic humite is used in cationic micro-particle / APAM retention aid system, it shows excellent retention effect; moreover, this retention system is insensitive to shear and pH, especially the ungrounded humite micro-particle has more excellent retention effect. Therefore, the retention aid system of ungrounded cationic humite micro-particle / APAM is an ideal retention aid system.

关 键 词: 阳离子硅镁石微粒 正电性 研磨 助留

领  域: [轻工技术与工程]

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