机构地区: 中国科学院沈阳自动化研究所
出 处: 《微计算机信息》 2010年第11期10-12,共3页
摘 要: 随着FPGA的发展,FPGA测试技术也得到了相应的发展。因为FPGA的结构和传统专用集成电路(ASIC)有着本质的区别,在FPGA中不能形成可测性设计电路,但它的可编程能力决定了其测试电路可以通过编程的方法来实现。本文讨论了Xilinx XC4000系列FPGA中CLB资源和互连资源的自动测试方法。而且提出了一种新的测试资源坐标定位方法,使得由软件仿真向器件真实测试取得了突破。并搭建了硬件测试平台。 With the development of FPGAs, testing technology for FPGAs has been developing. Because the structures of FPGAs are different from ASIC, the DFT circuits cannot be implemented. Its ability of programmable determines that the test circuits can be implemented by programming. This paper discusses the testing methods for interconnects and CLB of Xilinx XC400 serial FPGAs. A new TC to DC method is provided. The hardware flat is built. Testing a real FPGA chip is achieved.
领 域: [电子电信]