机构地区: 天津大学理学院
出 处: 《Transactions of Tianjin University》 1998年第2期80-85,共6页
摘 要: 以X射线光电子谱(XPS)为手段,研究了制备态和退火Co/C软X射线多层膜镜的界面化学态.研究表明,在制备态的Co/C软X射线多层膜的界面处存在互扩散,并为低角X射线衍射(LAXD)所证实.基于Miedema的“宏观原子”原子模型计算了Co-C系统中Co的化学位移,发现Co的化学位移低于XPS的能量分辨率,因此使用XPS不可能通过实验探测到Co-C系统中Co的化学位移.通过分析退火样品中Co-C和C-Co界面上C的化学态,发现界面处存在金属碳化物.研究还表明,XPS是研究多层膜界面化学态直观而有效的实验方法. Interfacial bonding in as deposited and annealed Co/C soft X ray multilayer structures is investigated by X ray photo electron spectroscopy (XPS).It is found that there is interdiffusion between cobalt and carbon in the as deposited Co/C multilayers,and this is confirmed by structure characterization using low angle X ray diffraction (LAXD).The calculation of the chemical shifts in Co C system based on Miedemas macroscopic atom model suggests that it is impossible to detect the chemical shift experimentally in the Co C compound,which is consistent with the XPS results.The presence of metallic carbide bonding is evidenced through the nature of the carbon bonding in survey taken at Co C and C Co interfaces of annealed samples.Our results also indicate that XPS is a direct method to probe the chemical bonding at the interfaces.