作　　者： ; ;

机构地区： 兰州工业高等专科学校电气工程系

出　　处： 《核电子学与探测技术》 2008年第6期1209-1211,1245,共4页

摘　　要： 由于空间辐射效应会导致SRAM器件单粒子翻转、单粒子锁定等现象的产生。文中介绍了SRAM辐射效应测试装置的硬件、软件构成及有关测试技术。通过对SRAM芯片电流的检测、断电保护,解决了在SRAM实验过程中SRAM芯片的损坏问题,利用该装置在不同的辐射实验源上对SRAM进行辐射效应实验研究,获得了预期的实验数据。为星载计算机系统存储器的运行寿命评估及加固设计提供重要参考依据。 Space radiation effects will lead to single event upset, event latch up and other phenomena in SRAM devices. This paper introduces the hardware, software composition and related testing technology of SRAM radiation effect testing device. Through to The SRAM chip current detection and power protection, it has solved the SRAM chip damage question in the SRAM experiment. It has accessed to the expected experimental data by using the device in different source of radiation conducted on SRAM Experi-mental study of radiation effects. It provides important references in the assessment of operational life and reinforcement of the memory carried in the satellites.

关 键 词： 静态随机存取存储器 辐射效应 单粒子翻转 单粒子锁定 测试系统

领　　域： [电子电信]