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阳离子硅镁石微粒性能及其对纸料的助留效果
Characteristic of Cationic Humite Micro-Particle and Its Effect as Retention Aid

作  者: ; ; ; ; ;

机构地区: 齐齐哈尔大学

出  处: 《纸和造纸》 2008年第4期37-39,共3页

摘  要: 研究阳离子硅镁石微粒的性能及其助留效果。研究发现,硅镁石微粒具有纳米级的粒径和较高的正电性,其正电性随着pH值增加逐渐降低;随着研磨时间延长,硅镁石微粒的粒径逐渐降低,但其正电性也随着明显降低。硅镁石阳离子微粒单独作为助留剂使用时,具有一定的助留效果,但其用量大且效果一般,并且抗剪切性能差,不是一种理想的助留助滤体系。硅镁石微粒与APAM组成的双元助留体系具有良好的助留效果,其中,未研磨的硅镁石微粒/APAM组成的体系具有良好的抗剪切性能和pH值适应性,因此,未研磨的硅镁石微粒与APAM组成的助留体系是一种理想的助留助滤体系。 Cationic humite micro-particle has been investigated as a retention and drainage aid. The results showed that the cationic humite micro-particle had high cationic Zeta potential and nanometer diameter. Its cationic Zeta potential increased while pH value dropped, and decreased while grinding time increased. There was some retention effect to CaCO3 fillers and fines when cationic humite was added plentifully alone, but which was sensitive to shear. When cationic humite was used as retention aid in cationic micro-particle/APAM retention aid system, it showed excellent retention effect; moreover, this retention system was insensitive to shear, especially the ungrounded humite micro-particle had more excellent retention effect. Therefore, the retention aid system of ungrounded cationic humite micro-particle/APAM was an ideal retention aid system.

关 键 词: 阳离子硅镁石微粒 正电性 研磨 助留

领  域: [轻工技术与工程]

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