作　　者： ; ; ; ;

机构地区： 中山大学物理科学与工程技术学院光电材料与技术国家重点实验室

出　　处： 《发光学报》 2007年第4期537-540,共4页

摘　　要： 用激光脉冲沉积(PLD)法在MgO(001)衬底上成功地生长、制备出了外延Sr0.61Ba0.39Nb2O6(SBN61)电光薄膜;通过SBN61电光薄膜椭偏光谱测量的分析研究,得到了SBN61电光薄膜的光学常数;通过电致双折射方法对生长在(001)MgO衬底上的SBN61薄膜的电光性能进行了测量研究,发现SBN61电光薄膜电致双折射的变化Δn与所加电场E成平方关系,其二次电光系数R=0.21×10-16(m/V)2。 Tetragonal tungsten-bronze-type strontium barium niobate （SBN） material is an attractive materials for many applications such as ferroelectric, pyroelectric, electro-optic, and photorefractive devices. A number of techniques for fabricating SBN ferroelectric fihns have been developed in the past years. Among these techniques, the pulsed laser deposition （PLD） technique is ideally suited to the epitaxial growth of SBN. The epitaxial Sr0.61Ba0.3gNb2O6 SBN61 thin films deposited on MgO（100） substrate have been prepared by pulsed laser deposition （PLD）. The structural properties of the thin films were studied by X-ray diffraction. The 0 - 20 scan pattern indicates single crystalline layers with the （001） orientation perpendicular to the substrate plane. The diffraction of SBN61 （001）, MGO（002） and SBN61 （002） are identified, and no trace of other diffraction is observed. The films are thus with single phase with c-axis perpendicular to the substrate. The lattice constant of c = 0. 392 3 nm was calculated, which is in good agreement with c = 0. 393 5 nm for bulk SBN61. Optical studies by spectroscopic eUipsometry （SE） measurements were carried out, and their optical constants were determined. It is found that the refractive index of the SBN61 films is almost the same as that of SBN61 single bulk crystal. The birenfrigence shift as a function of applied voltage of SBN61 thin films on MgO（001 ） were measured. The SBN61 samples showed a quadratic response and quadratic electrooptic coefficient R has been derived to be 0.21 × 10 ^-16 （m/V）^2 at 632.8 nm.

关 键 词： 铌酸锶钡 电光效应 光学常数

领　　域： [理学]