机构地区: 中国科学院沈阳自动化研究所
出 处: 《高技术通讯》 2007年第3期268-273,共6页
摘 要: 采用一种无耦合、三轴精确定位的纳米运动平台作为扫描器,研制了一种新型原子力显微镜(AFM)。该AFM有效消除了通常使用的单管式压电陶瓷扫描器扫描过程中运动耦合产生的两种结构误差——交叉耦合误差和扫描范围误差,极大提高了纳米测量及操作的精度。 In this article, a new atomic force microscope (AFM) with a nano positioning stage as its scanner is described. The stage has three piezoelectric actuators and can move in three directions with high accuracy without kinematic coupling. Thus in the new AFM, two kinds of structure errors——vertical cross coupling error and scanning size error which affect the precision of nano-observation and nanomanipulation due to the kinematic coupling of single tube during its bending scan motion are removed effectively, and the precision of nano-observation and nanomanipulation is improved greatly.