作　　者： ; ; ;

机构地区： 天津大学管理与经济学部

出　　处： 《组合机床与自动化加工技术》 2007年第5期6-10,共5页

摘　　要： 从Xbar-R控制图的假设检验问题出发,研究了t时刻样本均值(Xbar)和极差(R)处于控制限内不同位置时,Xbar-R控制图假设检验的第二类错误(β风险)问题。以此为基础,分析了t时刻样本均值与过程均值(μ)偏移量和过程极差偏移量对β风险的影响,据此提出了根据偏移量确定t时刻采样间隔的模型,同时,研究了在给定平均步长(ARL)的条件下,确定采样间隔的模型。研究结果表明,可以通过降低采样间隔来减少由于漏判而带来的损失。 Based on the hypothesis of Xbar-R control chart, the type Ⅱ error （β risk） of Xbar-R control chart was studied when the Sample＇ s mean at time t lied in different positions between upper control limit and lower control limit of Xbar-R chart, And the influence of the deviation between sample mean at time t and the process mean （μ） on the β risk was studied. Then a model of how to decide the sampling interval at time t with the deviation 8 was put forward. Furthermore, another model for sampling intervals decision based on a given average run length （ARL） was put forward too. The certification said that the quality loss can be reduced with the method of adaptive sampling intervals.

关 键 词： 控制图 采样间隔 自适应

领　　域： [自动化与计算机技术] [自动化与计算机技术]