作　　者： ; ;

机构地区： 同济大学中德学院

出　　处： 《仪器仪表用户》 2006年第1期72-73,共2页

摘　　要： 专用集成电路入检测试系统是根据《专用集成电路入检测试系统研制要求》的设备用途,被测对象的主要技术指标,测试系统的组成、功能及主要技术指标制定。通过引入通用测试仪表组,运用GPIB总线控制等方法, 开发研制了集成电路入检设备,该设备可对混合集成电路模块在常温条件下的技术指标进行测试。 The special-purpose integrated circuit check test system is developed according to the equipment use, the main technical specifications of the tested objects, the compositions and functions of the test system, and its main technical specification in ＂The Requirements of Developing Special-purpose Integrated Circuit Test System＂. By introducing the general measuring appliance group, applying GPIB bus control and so on, this special integrated circuit check testing equipment is developed, which can test the technical specifications of hybrid integrated circuit module under the normal temperature.

关 键 词： 专用集成电路 测试系统 通用测试仪表 线控制

领　　域： [电子电信]