作　　者： ; ; ; ; ;

机构地区： 重庆大学光电工程学院光电技术及系统教育部重点实验室

出　　处： 《光学仪器》 2004年第5期35-39,共5页

摘　　要： X射线光谱议是一种强有力的激光等离子体诊断工具。为了获取激光等离子体发射的X射线中所包含大量信息,基于椭圆几何原理设计制造了X射线弯晶谱议。在上海神光 号装置上利用LiF弯曲晶体分析器,用150J激光能量对Ti靶进行了试验。通过X射线CCD记录获取的谱线,结果表明这种聚焦型晶体分析器的灵敏度有了明显的提高。 Because X-ray spectrograph is a powerful tool to plasma diagnosis, to study the information and evolution of the plasma, in order to investigate the properties of laser produced plasmas, X-ray elliptical curved crystal spectrograph was designed and manufactured. The experiment was carried out on Shanghai Shenguang-Ⅱ Facility. Experimental results using LiF Curved crystal analyzer are described which show spectrum of Ti laser-plasma. Spectra showing the main resonance line were recorded with X-ray CCD and with laser energies 150J. The focusing crystal analyzer clearly gave an increase in sensitivity over a flat crystal.

关 键 词： 弯晶谱仪 晶体 激光等离子体 射线 椭圆 谱线 聚焦 分析器 激光能量

领　　域： [机械工程] [机械工程] [机械工程] [理学]